For:
Research: Optical and Semiconductor Devices
Strained-Si Field Effect Transistors
Substrates for Strained-Si-on-Insulator
Si:SiGe MOSFET-on-Air Through Post Processing Techniques
Low Temperature and Noise Modelling in Strained-Si FETs
CABOOM - Characterisation of Alloy Concentration by Bevelling, Oxidation and Optical Microscopy
BKFM: Kelvin Probe Microscopy on Bevelled Samples as Material Characterisation Technique
Combined Raman - Atomic Force Microscope
